The programme includes 2 days of frontal lessons and training (i.e. lessons, visits and practical demonstrations) at the Laboratories of the French Alternative Energies and Atomic Energy Commission (CEA).

12th February 2024

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• 13:00-13:30 > Arrival and Registration
• 13:30-14:30 > Lunch 
• 14:30-14:35 > Welcome and introduction

Nevine Rochat (CEA-Leti)

• 14:35-14:40 > Introduction to day 1

Marta Bragagnolo (Warrant Hub S.p.A.)

• 14:40-15:00 > Strain engineering in material science: modulation of the vibrational and optoelectronic properties in 2D materials

Elena Stellino (UNISAP)

• 15:00-15:40 > Metrology for process control in semiconductor industry

Delphine Le Cunff (ST_C )

• 15:40-16:20 > Introduction to strain characterization methods in Transmission Electron Microscopy

Roberto Balboni (CNR)

• 16:20-16:30 > Coffee Break 
• 16:30-17:10 > Metrological Raman spectroscopy for strain characterization

Stefan Wundrak (PTB)

• 17:10-17:50 > X-ray strain analysis in semiconductor metrology

Patrice Gergaud, Jerome Richy (CEA-LETI)

• 17:50-18:30 > Plasmonic enhanced optical spectroscopy – from the lab environment to the factory floors

Aaron Lewis (NANONICS)

13th February 2024

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• 9:00 – 9:25 > Arrival and Registration
• 9:25 – 9:30 > Introduction to day 2

Marta Bragagnolo (Warrant Hub S.p.A.)

• 9:30-10:10 > Enhanced Optical Heating of Silicon Nano-Cones Under CW Illumination

Sergey S. Kharintsev (SCANSENS)

• 10:10 – 10:50 > AI and machine learning algorithms for fast optical material metrology tools

Yovav Kalifon and Shira Esudr (NOVA)

• 10:50 – 11:10 > Coffee break
• 11:10 – 11:50 > Sustainable Silicon photovoltaic cell and module technology for the Terawatt era

Ivan Gordon (IMEC)

• 11:50 – 12:30 > Process control and QC on graphene

Amaia Zurutuza (GRAPHENEA)

• 12:30 – 13:10 > Metadata extraction, manipulation and data storage

Irio Lavagno (TIBERLAB)

• 13:10 – 14:20 > Lunch
• 14:20 – 15:00 > Transmission Electron Microscopy for 2D materials characterization & standardization

Vittorio Morandi (CNR-IMM)

• 15:00 – 16:30 > Round table with:

Ennio Capria (EMMC, EMCC, ESRF)