10 May 2024

We are pleased to inform you about the significant presence of the CHALLENGES consortium at the upcoming European Material Research Society (EMRS) Spring Meeting in Strasbourg (27-31 May, 2024). Part of the results obtained within the CHALLENGES project will be shown at the symposium ALTECH 2024 – Analytical Techniques for Accurate Nanoscale Characterisation of Advanced Materials. The work carried out by the various partners will be presented with the following line-up


28 May 2024 | 08:45 to 10:00

Raman Spectroscopy Machine-Learning Approach for Inline Application in the Semiconductor Industry | Roy PINHASSI (NOVA)

28 May 2024 | 16:30 to 18:30

16:30-16:45 – Strain analysis in semiconductor devices using tip-enhanced Raman spectroscopy | Chiara MANCINI (Sapienza University of Rome)

16:45-17:00 – On the accuracy of strain measurements by different TEM techniques Roberto BALBONI (CNR-IMM)

17:00-17:15 – Metrological Raman shift calibration for strain quantification in semiconductor Stefan | WUNDRACK (PTB)

17:15-17:30 – Design and implementation of a data management system for efficient Raman spectroscopy data handling Irio LAVAGNO (TiberLab)

In addition, four posters on the project topics will be presented:

  • Advanced TiN probes compatible with clean room for tip-enhanced Raman spectroscop by Giancarlo LA PENNA (Sapienza University of Rome)
  • Use of polarised Raman analysis for composition or strain measurement on ultrathin SOI and SiGeOI by Narciso GAMBACORTI (CEA-Leti)
  •  Silicon stress measurements by Raman spectroscopy Sergej SHASHKO (SOL Instruments) Unravelling the substrate effect on graphene through non-destructive multiscale Raman spectroscop by Chiara MANCINI (Sapienza University of Rome).

Below is the direct link to the symposium ALTECH: